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TEM thin film analysis of chemically deposited YBa2Cu3O7-x coated conductors

Published online by Cambridge University Press:  07 September 2007

L Molina ,
O Eibl ,
S Engel ,
K Knoth ,
R Hühne  and
B Holzapfel
L Molina
Affiliation:
University of Tübingen,Germany
O Eibl
Affiliation:
University of Tübingen,Germany
S Engel
Affiliation:
IFW Dresden,Germany
K Knoth
Affiliation:
IFW Dresden,Germany
R Hühne
Affiliation:
IFW Dresden,Germany
B Holzapfel
Affiliation:
IFW Dresden,Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 412 - 413
Copyright
Copyright © Microscopy Society of America 2007

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