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Crystallographic and Nanomechanical Analysis by Correlative In-situ AFM & SEM

Published online by Cambridge University Press:  01 August 2018

P. Frank ,
M. Leitner ,
S. Hummel ,
N. Hosseini ,
Y. Wang ,
R. Winkler ,
G. E. Fantner ,
H. Plank ,
Y. Zeng  and
C. H. Schwalb
P. Frank
Affiliation:
GETec Microscopy GmbH, Vienna, Austria
M. Leitner
Affiliation:
GETec Microscopy GmbH, Vienna, Austria
S. Hummel
Affiliation:
GETec Microscopy GmbH, Vienna, Austria
N. Hosseini
Affiliation:
Laboratory for Bio- and Nano-Instrumentation, Institute for Bioengineering, EPFL, Switzerland
Y. Wang
Affiliation:
The State Key Lab of High Performance Ceramics and Superfine Microstructure, SICCAS, China
R. Winkler
Affiliation:
Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Austria.
G. E. Fantner
Affiliation:
Laboratory for Bio- and Nano-Instrumentation, Institute for Bioengineering, EPFL, Switzerland
H. Plank
Affiliation:
Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Austria.
Y. Zeng
Affiliation:
The State Key Lab of High Performance Ceramics and Superfine Microstructure, SICCAS, China
C. H. Schwalb
Affiliation:
GETec Microscopy GmbH, Vienna, Austria

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2280 - 2281
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Dukic, M, Adams, JD Fantner, GE Scientific Reports 5 2015 16393.Google Scholar
[2] Wang, Y, et al, submitted to Scientific Reports (2018).Google Scholar