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Atomic Mapping of Domain Configurations in Ferroelectric Thin Films

Published online by Cambridge University Press:  04 August 2017

Y. L. Tang ,
Y. L. Zhu ,
Y. Liu ,
Y. J. Wang  and
X. L. Ma
Y. L. Tang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. L. Zhu
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. Liu
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. J. Wang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
X. L. Ma
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China School of Materials Science and Engineering, Lanzhou University of Technology, Langongping Road 287, 730050 Lanzhou, China

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1614 - 1615
Copyright
© Microscopy Society of America 2017 

References

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[6] Liu, Y, et al, Adv. Mater. Interfaces 2016). DOI: 10.1002/admi.201600342.Google Scholar
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[8] The authors acknowledge funding from the National Natural Science Foundation of China (No. 51231007, 51571197, 51501194, 51671194 and 51521091), National Basic Research Program of China (2014CB921002), and the Key Research Program of Frontier Sciences CAS (QYZDJ-SSW-JSC010). YL Tang acknowledges the IMR SYNL-T.S. Kê Research Fellowship and the Youth Innovation Promotion Association CAS (No. 2016177).Google Scholar