Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999
Irradiation and Implantation Effects in Materials
Observation of an Elementary Cuboctahedron Of Xe Nanocrystal in an Al Matrix
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- 02 July 2020, pp. 764-765
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AES and SEM/EDS Analysis of Silvered Teflon Laminates of Optical Solar Reflector
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- 02 July 2020, pp. 766-767
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Future of Microscopy: Ceramics, Composites, and Cement
EELS and Xanes Analysis of Plutonium and Cerium Edges From Titanate Ceramics for Fissile Materials Disposal
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- 02 July 2020, pp. 768-769
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Microstructural and Compositional Characterization of SiC-On-Insulator Structures
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- 02 July 2020, pp. 770-771
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Relationship Between High-Strain-Rate Superplasticity and Interface Microstructure in Aluminum Alloy Composites
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- 02 July 2020, pp. 772-773
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Nanoscale Structural Characterization at the Titanium/Sol-Gel/Primer/PETI-5 Interface
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- 02 July 2020, pp. 774-775
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Nanoindentation in Tin/Nbn Multilayers and Thin Films Examined Using Transmission Electron Microscopy
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- 02 July 2020, pp. 776-777
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Heterogeneous Formation of Oriented Silicon Oxynitride on α-Si3N4 Seed Crystals : Habits And Radiation Stability
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- 02 July 2020, pp. 778-779
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In Situ Observation of Ferroelectric Domain Motion in BaTiO3
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- 02 July 2020, pp. 780-781
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Combined HRTEM and High Spatial Resolution Analysis of Homologous Compounds InMO3(ZNO)m By A 300kv FE-TEM
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- 02 July 2020, pp. 782-783
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Analytical Electron Microscopy of Composite Interfaces
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- 02 July 2020, pp. 784-785
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Alchemi Analysis of Cation Distributions in Spinel-Structured Compounds Using Oxygen as a Marker Element
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- 02 July 2020, pp. 786-787
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Electron Spectroscopic Imaging and Diffraction: Ideal Tools for the Characterization of Ceramic Materials
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- 02 July 2020, pp. 788-789
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Local Density Information From Low Energy-Loss Peels Measurements
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- 02 July 2020, pp. 790-791
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Cation Coordination At Σ Grain Boundaries in TiO2 and SrTiO3, and its Effect on the Local Electronic Properties
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- 02 July 2020, pp. 792-793
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Characterization of Ceramics Using Electron Backscatter Diffraction in the SEM
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- 02 July 2020, pp. 794-795
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The Study of Grain Boundaries in Ag-Sheathed Bscco Tapes by Scanning Transmission Electron Microscopy
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- 02 July 2020, pp. 796-797
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Growth and Texture of Polycrystalline SIC on Graphite During Forced flow Thermal Gradient Chemical Vapor Infiltration (FCVI)
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- 02 July 2020, pp. 798-799
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Migration of Silicate Liquid Out of Grain Boundaries in Ceramics
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- 02 July 2020, pp. 800-801
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Segregation of Ba to Cr Thin Film and Glass Interfaces
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- 02 July 2020, pp. 802-803
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