Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-29T22:57:45.827Z Has data issue: false hasContentIssue false
  • English
  • Français

The Study of Grain Boundaries in Ag-Sheathed Bscco Tapes by Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

K. Kishida ,
Y. Pan  and
N.D. Browning
K. Kishida
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059
Y. Pan
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059
N.D. Browning
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059
Get access

Extract

Highly textured (Bi,Pb)2Sr2Ca2Cu3O10(Bi-2223)/Ag composite tapes have received considerable attention as high-Tc superconducting materials for electric power and high-magnetic-field applications because of their relatively high-critical current densities and their flexibility. In order to improve the performance of these tapes for many commercial applications, it is essential that the mechanisms that limit the critical current density are fully understood. Previous microscopical studies of these tapes have revealed that interfaces such as grain boundaries strongly influence the transport of large currents1. From a morphological point of view, several models have been proposed to describe potential current transport mechanisms. However, as these models consider mainly the large-scale configuration of the boundaries, the underlying mechanism controlling the properties is still unclear. In order to elucidate the exact role of grain boundaries, systematical studies on the effect of the atomic structure as well as any chemistry change that occurs at the interface are required.

Type
Future of Microscopy: Ceramics, Composites, and Cement
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 796 - 797
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Umezawa, A.et al.,Physica C 219 (1994) 378.CrossRefGoogle Scholar
2.Riley, G.N.et al.,JOM 49(10) (1997) 24.CrossRefGoogle Scholar
3.Pennycook, S.J. and Jesson, D.E., Ultramicroscopy 37 (1991) 14.CrossRefGoogle Scholar
4.Zhu, Y.M.et al.,Phys. Rev. B 57 (1998) 8601.CrossRefGoogle Scholar
5. We would like to thank Mark, Teplitskyof American Superconductor for providing the samples and for valuable discussions. This research is funded by NSF(DMR-9803021, DMR-9601792). KK greatly appreciates the support from Research Fellowships of the Japan Society for the Promotion of Science for Young Scientists.Google Scholar