Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis

Machine Learning of In-situ Temperature Reconstruction from Metal-nanoparticle Thermometry on Transmission Electron Microscopy

NanoMi: An Open Source Electron Microscope Component Integration

Neural Architecture Search for Transmission Electron Microscopy: Rapid Automation of Phase and Orientation Determination in TEM images

Spatial Order of Latent Variables to Characterize Multi-range Symmetry Lowering Distortions in a Pd3Bi2Se2 Superconductor

“Push-Button Microscopy”: Automated Instrument Alignment and Reciprocal-space Navigation using PyJEM

Vendor Symposium

Advanced In Situ TEM Nanomechanical Testing Options with the PI-95

Argon Milling of Bulk and Post-FIB Specimens for Multi-Length Scale Analyses by EBSD, TEM, and APT under Controlled Environments

Diffuse Scattering from a RAFA Lens Produced High-Intensity, Far-Focused, Small 3D Virtual Source

Improving Data from Electron Backscatter Diffraction Experiments using Pattern Matching Techniques

Millimeter-scale, Large Uniform Area Semiconductor Device Delayering for Physical Failure Analyses and Quality Control

New Product Announcement – Invizo 6000, New Applications, New Performance

New Product Announcement – LEAP 6000XR, New Applications, New Performance

The Performance of Detectors for Diffraction-Based Studies in (S)TEM.

Technologists' Forum, Tutorials, and Outreach

Building a Volume Electron Microscopy Community

Don't be a Scatterbrain: Tissue Clearing Techniques and Considerations for Brain and Body

Mechanistic Understanding and Technical Considerations for iDISCO Application

Using Expansion Microscopy for Nanoscale Imaging of Biological Structures

CryoAPEX: inception, growth and evolution of the method

Indirect Correlative Light and Electron Microscopy – A High Throughput Approach with Robust Quantitative Capabilities

Precession Electron Diffraction for Electron Crystallography

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis

Vendor Symposium

Technologists' Forum, Tutorials, and Outreach