Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Physical Sciences Symposia

Imaging and Analysis of Cultural Heritage Materials

Abstract

Decomposing Apricots: Tracking Transformation of Arsenic Sulfide pigments in a Dutch Golden Age Still-life.

Micro XRF Imaging of Daguerreotypes

Detecting Iron-based Pigments on Ruthenium-coated Archaeological Pottery by SEM-EDS and by Micro-XRF-SEM

Nanometer-Scale Proximal Probe Thermal Desorption Coupled with Laser Mass Spectrometry

Investigation on Manufacturing Process in Some Elamite Copper Alloy Artefacts from Haft Tappeh, South-west Iran

SEM and ToF-SIMS Ion Imaging Applied to Characterization of Fungal Biodeterioration of Paper in the Context of Cultural Heritage Collections

Investigating the Firing Protocol of Athenian Pottery Production: A Raman and Hi-Resolution TEM Study

Soft X-ray Absorption Spectroscopy and Imaging of Sulfur in Lapis Lazuli

Investigation into Achaemenid Persian Painted Plasters and Glazed Bricks from Persepolis and Pasargadae in the Smithsonian's Freer Gallery of Art

Manganese in Black Crusts on Seneca Sandstone

Surface & Subsurface Microscopy & Microanalysis in Materials & Biological Systems

Abstract

Simplified, High-Throughput TOF-SIMS Analysis via HR2 and Uniform Molecular Imaging of Rough Surfaces

Probing Liquid Surfaces and Interfaces Using Time-of-Flight Secondary Ion Mass Spectrometry

Multivariate Analysis Applications in ToF-SIMS

Nanoscale Surface and Sub-Surface Chemical Analysis of SiGe Nanowires

AES and Related Techniques for Yield Improvement, Metrology and Development Support of ULSI Circuits Manufactured in ≤ 28nm CMOS Technology

Nanoscale Organic Defect Characterization with AFM-IR

Multiplexed Biomimetic Lipid Membranes on Graphene by Dip-Pen Nanolithography

Complimentary XPS and AES Analysis of MoS3 Solid Lubricant Coatings

Chemical Characterization of Material Surfaces Using X-ray Photoelectron Spectroscopy (XPS): The Perfect Complement to Electron Microscopy Techniques

SEM, TEM, and AFM Analyses of Phase-Separated Polymer Blend Membranes for Gas Separations

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Physical Sciences Symposia

Imaging and Analysis of Cultural Heritage Materials

Abstract

Surface & Subsurface Microscopy & Microanalysis in Materials & Biological Systems

Abstract