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Nanoscale Organic Defect Characterization with AFM-IR

Published online by Cambridge University Press:  27 August 2014

Curtis Marcott ,
Michael Lo ,
Qichi Hu ,
Kevin Kjoller  and
Craig B. Prater
Curtis Marcott
Affiliation:
Light Light Solutions, Athens, GA, USA
Michael Lo
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA
Qichi Hu
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA
Kevin Kjoller
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA
Craig B. Prater
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2056 - 2057
Copyright
Copyright © Microscopy Society of America 2014 

References

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[4] Marcott, C., et al, Appl. Spectrosc. 65 (2011), p. 1145.Google Scholar
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[8] The authors acknowledge funding from NSF-SBIR grant 0750512 and NSF-SBIR grant 0944400.Google Scholar