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Simplified, High-Throughput TOF-SIMS Analysis via HR2 and Uniform Molecular Imaging of Rough Surfaces

Published online by Cambridge University Press:  27 August 2014

Gregory L. Fisher
Gregory L. Fisher*
Affiliation:
Physical Electronics, Chanhassen, MN, United States

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2046 - 2047
Copyright
Copyright © Microscopy Society of America 2014