Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Physical Sciences Symposia

Microscopy and Characterization of Ceramics, Polymers, and Composites

Abstract

Oxygen Exchange Kineics of Thin Ftilms Studied by Optical Transmission Relaxation: Correlation with Surface Composition and Microstructure

Microstructural Investigations of Platinum Shape Equilibration in Alumina

Grain Boundary Engineering at the Interface of Ceramic and Composite Materials used in Alternative Energy Technologies

High Resolution Electron Microscopy Characterization of (La0.5Sr0.5)2CoC4 Thin Film Cathode Materials

The Role of Microscopy in Understanding Ceramic Processing

Atomic Structure Determination of Ba4Ti5O10 and Ba4Ti4O11 in Epitaxial Barium Titanate Nanodomains Using HRTEM and Electron Diffraction

Direct Observation of Atomic Surface Structures of CeO2 Nanoparticles

Synthesis of Silver Doped TiO2 Nanostructured Composites for Photocatalytic Applications

High Speed SPM for Novel Property Mapping of Functional Ceramics

Multilayered Cr(Al)N/SiOx Nanocomposite Coatings Fabricated by Differential Pumping Cosputtering

Oxygen Vacancies at Grain Boundaries in Doubly-Doped Ceria Determined using EELS

Anti-Polar Ordering in Polycrystalline Samarium Doped BiFeO3

Characterization of Tetragonal-Monoclinic, Ferroelastic Transformation and Domain Boundaries in Zirconia-Alloyed Yttrium Tantalate

Microstructure-Property Relations in Melt Processed and Spark Plasma Sintered Ceramic Waste Forms

Quantitative Morphology Characterization of New PC-siloxane Copolymer Blends

Nanodiffraction Characterization of Grain Boundary Structures in Nanocrystalline MgAl2O4 prepared by Electric Field Assisted Sintering

Visualizing Hydrated Polymeric Membranes Using X-Ray Microscopy

Sensitivity of an Atomic Force Microscope Cantilever with a Crack

Microstructural Changes and Enhanced Current Density in Nano-sized HfO2 Added (Bi1.6Pb0.4Sr2Ca2Cu3O10)/Ag Superconductor Tapes

Optimization of Image Contrast for Size Distribution Measurements of Nanomaterials by Transmission Electron Microscopies Including TEM and T-SEM

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Physical Sciences Symposia

Microscopy and Characterization of Ceramics, Polymers, and Composites

Abstract