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High Resolution Electron Microscopy Characterization of (La0.5Sr0.5)2CoC4 Thin Film Cathode Materials

Published online by Cambridge University Press:  27 August 2014

F. Yang ,
Y. Chen ,
Z. Cai ,
N. Tsvetkov ,
M. Burriel ,
H. Tellez ,
B. Yildiz ,
J. A. Kilner ,
D.B. Williams  and
D.W. McComb
F. Yang
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, USA
Y. Chen
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Boston,USA
Z. Cai
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Boston,USA
N. Tsvetkov
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Boston,USA
M. Burriel
Affiliation:
Department of Materials, Imperial College, London, UK
H. Tellez
Affiliation:
International Institute for Carbon-Neutral Energy Research, Kyushu University, Fukuoka, Japan
B. Yildiz
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Boston,USA
J. A. Kilner
Affiliation:
Department of Materials, Imperial College, London, UK
D.B. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, USA
D.W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1912 - 1913
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Chroneos, A, Yildiz, B, Tarancon, A, Parfitt, D, Kilner, JA Energy & Environmetal Science 4 (2011), p. 2274.Google Scholar
[2] Kushima, A, Parfitt, D, Chroneos, A, Yildiz, B, Kilner, JA, Grimes, RW Physical Chemistry Chemical Physics 13 (2011),p.2242.Google Scholar