Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

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Proceedings of Microscopy & Microanalysis 2012

Volume 18 - Issue S2 - July 2012

Contents

Page 27 of 50

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-08

Research Article

Low Accelerating Voltage, X-ray Microanalysis: Benefits and Challenges
P. McSwiggen, N. Mori, T. Ohta, C. Nielsen
Published online by Cambridge University Press:

23 November 2012, pp. 1042-1043
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microanalysis of the Elemental Distribution in Particlesof Zn(OH)2 Obtained by Chemical Precipitation.
L. Bejar, A. Medina, R. Vargas, G. Herrera, I. Alfonso
Published online by Cambridge University Press:

23 November 2012, pp. 1044-1045
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors
M. Rathi, P. Ahrenkiel, J. Carapella, M. Wanlass
Published online by Cambridge University Press:

23 November 2012, pp. 1046-1047
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Minor and Trace Element Qualitative Analysis in VP-ESEM Part 1
R.A. Carlton
Published online by Cambridge University Press:

23 November 2012, pp. 1048-1049
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Evaluation of Analytical Models and Monte Carlo Programs with Experimental phi-rho-z Depth Distribution for Quantitative Microanalysis
H. Demers, R. Gauvin
Published online by Cambridge University Press:

23 November 2012, pp. 1050-1051
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Compositional change of NaCl particles under electron beam irradiation measured by time-resolved X-ray analysis
I. Ohnishi, K. Shibuya, K. Tachibana, J. Yamagata, M. Morita, T. Watanabe, S. Miyazawa, H. Takahashi, Y. Ohkura, Y. Kondo
Published online by Cambridge University Press:

23 November 2012, pp. 1052-1053
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Drilling Down Into The Cathodoluminescence And Compositional Variation In Jadeite
S. Wight, J.M. Davis, D.C. Meier, E.P. Vicenzi
Published online by Cambridge University Press:

23 November 2012, pp. 1054-1055
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Tracing Pigment Patterns of Iron-based Paint on Ancestral Puebloan Pottery by SEM-EDS Without the Use of Carbon Coating
M.W. Pendleton, E.A. Ellis, D.K. Washburn, B.B. Pendleton
Published online by Cambridge University Press:

23 November 2012, pp. 1056-1057
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-09

Research Article

SDD-EDS: Element Analysis of Nanostructures in TEM
M. Falke, A. Kaeppel, S. Scheller, W. Hahn, R. Terborg, M. Rohde, Q. Ramasse, T.C. Lovejoy, N. Dellby, Z.S. Szilagyi, O.L. Krivanek
Published online by Cambridge University Press:

23 November 2012, pp. 1058-1059
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of a Microcalorimeter in comparison to Silicon Drift Detectors
R. Terborg, R. Cantor, H. Naito
Published online by Cambridge University Press:

23 November 2012, pp. 1060-1061
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Modeling High Count Rate EDS Analysis and its Effect on Analytical Uncertainties and Detection Limits
F. Eggert, B. Anderhalt, J. Nicolosi
Published online by Cambridge University Press:

23 November 2012, pp. 1062-1063
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

EDS Spectrometry at Low Accelerating Voltages: Pushing the Boundaries of Nano- and Light Element Analysis with Enhanced SDD Technology
S. Scheller, J. Berlin, T. Salge, R. Terborg, M. Falke
Published online by Cambridge University Press:

23 November 2012, pp. 1064-1065
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Trace Element Analysis and Sum Peaks in EDS
R. Anderhalt, F. Eggert, T. Nylese, L. Chan
Published online by Cambridge University Press:

23 November 2012, pp. 1066-1067
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Data Quality and Acquisition Time in Energy Dispersive Spectroscopy
K. Thompson, P. Camus, D. Rohde
Published online by Cambridge University Press:

23 November 2012, pp. 1068-1069
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-situ Experiments in Liquids and Gases Using Electron-Optical Instruments-01

Research Article

Progress in imaging in a gaseous environment: in situ techniques and applications using environmental SEM (ESEM)
D.J. Stokes
Published online by Cambridge University Press:

23 November 2012, pp. 1070-1071
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-Situ TEM in Complex Environments: Photocatalysis
S.J. Dillon, Y. Liu
Published online by Cambridge University Press:

23 November 2012, pp. 1072-1073
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In Situ Visible and UV Illumination of ETEM Samples
B. Miller, P.A. Crozier
Published online by Cambridge University Press:

23 November 2012, pp. 1074-1075
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Fast Electron – Gas Interactions in an Environmental TEM
J.B. Wagner, T.W. Hansen
Published online by Cambridge University Press:

23 November 2012, pp. 1076-1077
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Local temperature measurement of 1 bar gas in a TEM nanoreactor
S.B. Vendelbo, P.J. Kooyman
Published online by Cambridge University Press:

23 November 2012, pp. 1078-1079
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-situ Experiments in Liquids and Gases Using Electron-Optical Instruments-02

Research Article

Vapour-phase growth of III-V semiconductor nanowires in situ in the TEM
F.M. Ross
Published online by Cambridge University Press:

23 November 2012, pp. 1080-1081
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Page 27 of 50

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-08

Research Article

Low Accelerating Voltage, X-ray Microanalysis: Benefits and Challenges

Microanalysis of the Elemental Distribution in Particlesof Zn(OH)2 Obtained by Chemical Precipitation.

A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors

Minor and Trace Element Qualitative Analysis in VP-ESEM Part 1

Evaluation of Analytical Models and Monte Carlo Programs with Experimental phi-rho-z Depth Distribution for Quantitative Microanalysis

Compositional change of NaCl particles under electron beam irradiation measured by time-resolved X-ray analysis

Drilling Down Into The Cathodoluminescence And Compositional Variation In Jadeite

Tracing Pigment Patterns of Iron-based Paint on Ancestral Puebloan Pottery by SEM-EDS Without the Use of Carbon Coating

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-09

Research Article

SDD-EDS: Element Analysis of Nanostructures in TEM

Characterization of a Microcalorimeter in comparison to Silicon Drift Detectors

Modeling High Count Rate EDS Analysis and its Effect on Analytical Uncertainties and Detection Limits

EDS Spectrometry at Low Accelerating Voltages: Pushing the Boundaries of Nano- and Light Element Analysis with Enhanced SDD Technology

Trace Element Analysis and Sum Peaks in EDS

Data Quality and Acquisition Time in Energy Dispersive Spectroscopy

In-situ Experiments in Liquids and Gases Using Electron-Optical Instruments-01

Research Article

Progress in imaging in a gaseous environment: in situ techniques and applications using environmental SEM (ESEM)

In-Situ TEM in Complex Environments: Photocatalysis

In Situ Visible and UV Illumination of ETEM Samples

Fast Electron – Gas Interactions in an Environmental TEM

Local temperature measurement of 1 bar gas in a TEM nanoreactor

In-situ Experiments in Liquids and Gases Using Electron-Optical Instruments-02

Research Article

Vapour-phase growth of III-V semiconductor nanowires in situ in the TEM

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-08

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-09

Research Article

In-situ Experiments in Liquids and Gases Using Electron-Optical Instruments-01

Research Article

In-situ Experiments in Liquids and Gases Using Electron-Optical Instruments-02

Research Article