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Study of Thin-Film Ferroelectric Heterostructures by TEM and PFM

Published online by Cambridge University Press:  09 April 2017

J Jokisaari ,
C Nelson ,
S Kim ,
P Gao ,
S Baek ,
C Eom  and
X Pan
J Jokisaari
Affiliation:
University of Michigan
C Nelson
Affiliation:
University of Michigan
S Kim
Affiliation:
University of Michigan
P Gao
Affiliation:
University of Michigan
S Baek
Affiliation:
University of Wisconsin
C Eom
Affiliation:
University of Wisconsin
X Pan
Affiliation:
The University of Michigan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1448 - 1449
Copyright
Copyright © Microscopy Society of America 2011