Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

A Quasi In Situ HRTEM Study of the Air Stability of (Ni/Co)MoS2 Hydrodesulfurization Catalysts

Tracking Ionic Transport and Electrochemical Dynamics in Battery Electrodes Using in situ TEM-EELS

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Effects of Quantized, Transient Chromatic Aberrations in Ultrafast Electron Microscopy

Effects of Electron-Gun and Laser Parameters on Collection Efficiency and Packet Duration in Ultrafast Electron Microscopy

Ultrafast Point Projection Electron Microscopy

Quantitative Determination of Thermal Fields and Transformation Rates in Rapidly Solidifying Aluminum by Numerical Modeling and In-situ TEM

A06 Advanced Analytical TEM/STEM

Abstract

Dynamical Effects on Atomic-Resolution Imaging and Diffraction of the Tetragonal and Orthorhombic Phases of LaFeAsO

Phase Determination of Black TiO2 Nanoparticles

Scanning Transmission Electron Microscopy Investigation of the Structure of Multilayered Perpendicular Magnetic Tunnel Junctions

Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis

Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique

Concentration at Detection Limit of Dopant for Semiconductor Samples Using Dual SDD Analysis System

Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra

Materials Selection for Ultra-Thin Diamond-Like Carbon Film Metrology and Structural Characterization by TEM

STEM characterization of Gold-Copper anisotropic nanocrystals

EFTEM Contrast Tuning and EELS Fine Structure Analysis for Characterization of Carbon Containing Ultra-Low-k Dielectric Materials

A12 Low Voltage Electron Microscopy

Abstract

The OTO Specimen Preparation Method for Optimal Scanning Electron Microscopy Imaging of Pseudomonas aeruginosa

Thin Film and Multilayer Scintillators for Low Voltage Backscattered Electron Imaging in the Scanning Electron Microscope

Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage

Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A12 Low Voltage Electron Microscopy

Abstract