Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-26T15:17:59.154Z Has data issue: false hasContentIssue false

Scanning Transmission Electron Microscopy Investigation of the Structure of Multilayered Perpendicular Magnetic Tunnel Junctions

Published online by Cambridge University Press:  23 September 2015

Danielle Reifsnyder Hickey
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Ikeda, S, et al, Nat. Mater 9 (2010) 721.CrossRefGoogle Scholar
[2] Wang, WG, et al, Appl. Phys. Lett 95 (2009) 242501.Google Scholar
[3] Liu, T, et al, Sci. Rep 4 (2014) 5895.Google Scholar
[4] Wang, W-G, et al, Nat. Mater 11 (2012) 64.CrossRefGoogle Scholar
[5] Gan, HD, et al, Appl. Phys. Lett 99 (2011) 252507.Google Scholar
[6] The authors gratefully acknowledge the preparation of p-MTJ samples by the research group of Prof. Weigang Wang in the Department of Physics at the University of Arizona, and funding provided by the Center for Spintronics, a STARNET program administered by the Semiconductor Research Corporation.Google Scholar