Physical Sciences Symposia
Inside Modern Micro-devices at the Atomic Scale
Abstract
An application of energy-filtered elemental mapping tomography in semiconductor device analysis
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- 01 August 2010, pp. 1922-1923
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Strain Profiles in Si Channel of PMOS Devices Affected by Shallow-Trench Isolation Strain Relaxation In Embedded SiGe
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- 01 August 2010, pp. 1924-1925
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Two-Dimensional Dopant Profiling in Silicon by SEM in Combination with Electrostatic Calculations
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- 01 August 2010, pp. 1926-1927
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Technologists’ Forum
Technologists’ Forum Platform Session
Abstract
Application of Various Imaging Techniques in the Study of Bone Tissue Formation Enabled by Biomimetic Nanomaterials
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- 01 August 2010, pp. 1928-1929
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Atomic Force Microscopy of Biomaterials, Mica, and the Origins of Life
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- 01 August 2010, pp. 1930-1931
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Multi-modal Imaging of Cell-Biomaterial Interactions Under Dynamic Chemical and Mechanical Environments
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- 01 August 2010, pp. 1932-1933
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Technologists’ Forum Special Topics: Materials Characterization of Nanomaterials: Health and Environmental Impact
Abstract
Analytical Microscopy Techniques in Support of Nanoparticle Environmental Safety & Health Considerations
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- 01 August 2010, pp. 1934-1935
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Particle Characterization of Environmental Soots via HRTEM and XPS Techniques
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- 01 August 2010, pp. 1936-1937
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Multifunctional and Multimodal Plasmonic Nanoparticles in Imaging and Therapy
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- 01 August 2010, pp. 1938-1939
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The Utility of TEM and AFM Techniques in the Preclinical Assessment of Nanomaterials
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- 01 August 2010, pp. 1940-1941
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Biological Science Tutorials
Cryo-HRSEM Techniques for Biological and Soft Materials Specimens
Abstract
Cryo-HRSEM Techniques for Biological and Soft Materials Specimens
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- 01 August 2010, pp. 1942-1943
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Focused Ion Beam Techniques in Biology
Abstract
Focused Ion Beam Applications in Biology
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- 01 August 2010, pp. 1944-1945
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Physical Sciences Tutorials
EELS & EFTEM Imaging: Instrumentation, Applications and Artifacts
Abstract
EELS & EFTEM Imaging: Instrumentation, Applications and Artifacts
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- 01 August 2010, pp. 1946-1947
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Principles and Practice of HREM and HAADF Imaging
Abstract
Principles and Practice of HREM and HAADF Imaging
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- 01 August 2010, pp. 1948-1949
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Other Educational Opportunities
Microscopy in the Classroom: How to Use It and How to Teach It
Abstract
The National Technology Infrastructure Network's Education and Outreach Programs - Understanding Size and Scale
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- 01 August 2010, pp. 1950-1951
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Microscopic Explorations Adapted for a Saturday Science Class
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- 01 August 2010, pp. 1952-1953
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Using the Scanning Electron Microscope for a Summer Forensics Camp
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- 01 August 2010, pp. 1954-1955
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Focus on Success: Teaching Scanning Electron Microscopy at the Community College
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- 01 August 2010, pp. 1956-1957
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Incorporating Advanced Microscopy Techniques into the Undergraduate Curriculum
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- 01 August 2010, pp. 1958-1959
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Project MICRO in Vermont: An Opportunity for Core Facility Outreach
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- 01 August 2010, pp. 1960-1961
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