Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

New Frontiers in Atom Probe Tomography Applications

Direct Observation of Hydrogen in Cold-Drawn Pearlitic Steel Wires Using Cryogenic Atom Probe Tomography

Isotopic Composition and Origin of Meteoritic Nanodiamonds studied by Atom-Probe Tomography and Complementary Techniques

Novel Synthesis and Multi-technique Characterisation of Au-Cu Nanoparticles

Atomic-scale Observation of Hydroxyapatite Nanoparticle

Atomic-scale characterisation of catalyst nanoparticles in ionic liquids by atom probe tomography

Atom Probe Tomography of Oxidised Grain Boundaries in Highly Irradiated SS316

Nanoindentation, EPMA and Atom Probe Tomography Characterisation of Oxygen-rich Layer formed on a Titanium Jet Engine Component

Spatial Reconstruction of Atom Probe Data from Zircon

Deformation of Borides in Nickel-based Superalloys: a Study of Segregation at Dislocations

Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO2

Influence of Composition and Structure on Measured H Concentration in beta-Ti Alloys via Atom Probe Tomography

Complementary SEM-EDS / FIB-SEM Sample Preparation Techniques for Atom Probe Tomography of nanophase-Fe0 in Apollo 16 Regolith Sample 61501,22

Atom Probe Tomography Investigation on the Effect of Ni Additions on the Site Occupation and Partitioning Behavior in Co-Based Superalloys

In situ Crystallization of Metallic Glass in an Atom Probe Instrument

Performance of Ultra-Violet Laser Pulsing with a Wire-Geometry, Moderately Focused Atom Probe System (EIKOS)

An Atom-probe Tomography Study of the Stability of Oxide-dispersion Strengthening Particles in 14YWT exposed to Neutron Irradiation

Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy

Advanced Characterization of Components Fabricated by Additive Manufacturing

Porosity Formation and Meltpool Geometry Analysis Using High-speed, in situ Imaging of Directed Energy Deposition

High Resolution X-ray Microscopy for 3D Characterization and Qualification of AM Materials

Understanding the High Strength of L-PBF Metals Using in and ex situ Characterization by TEM and Synchrotron XRD

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

New Frontiers in Atom Probe Tomography Applications

Advanced Characterization of Components Fabricated by Additive Manufacturing