Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Advances in Characterization of Geological and Extraterrestrial Samples

Hayabusa2: Sample Acquisition at a Near-Earth C-type Asteroid Ryugu and Analysis Plan of Returned Samples

Evaluation of Various Methods for Determining Bulk Compositions of Chondrules and Other Objects in Petrographic Thin Sections

Space Rocks and Optimizing Scanning Electron Channeling Contrast

A Nanoscale Record of Impact-Induced Pb Mobility in Lunar Zircon

Structure Determination of Donwilhelmsite by Electron Diffraction Tomography

Amorphous and Nano-Crystalline Materials in Pristine Carbonaceous Chondrite Meteorites

In situ Ion Irradiation and Heating Experiments in the Transmission Electron Microscope: Simulations of Dust Processing in Circumstellar Environments

Analysis of in situ Nanodiamonds in Organic Matter from Primitive Meteorites with Electron Energy-Loss Spectroscopy and Energy Dispersive X-ray Spectroscopy

Understanding the Origin and Evolution of Meteoritic Refractory Minerals Through Transmission Electron Microscopy

Non-invasive 3D Crystallography of Geological Media in the Laboratory

Three-Dimensional Rock Microstructure Modeling Using Two-Dimensional SEM Micrographs

Mineral Surface Transformations by Ice Nucleation

Correlative Microscopy of Diverse Filamentous Microfossils from 850 Ma Rocks

Automated Feature Analysis of Complex Geological Materials

Microanalytical Characterization of REE Phases in a Glauconitic Sandstone

Low-dose HRTEM Study of Interstratified Clay Minerals

STEM EDS/EELS for Phase Analysis of Deep-Mantle Rock Assemblages Supported by Machine Learning

Addressing the Difficulties of Differentiating Members of the Feldspar Solid Solution Series via Electron Backscatter Diffraction

Application of Combined Mean Atomic Number Backgrounds and Blank Corrections to EPMA Trace Element Measurements: Successes and Challenges

Can the Source Location of a Coloured Quartz Gemstone Be Determined from Non-Destructive Chemical Analysis?

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Advances in Characterization of Geological and Extraterrestrial Samples