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High Resolution X-ray Microscopy for 3D Characterization and Qualification of AM Materials

Published online by Cambridge University Press:  05 August 2019

William M. Harris ,
Hrishikesh Bale  and
Stephen T. Kelly
William M. Harris*
Affiliation:
Carl Zeiss Microscopy, Pleasanton, CA, USA.
Hrishikesh Bale
Affiliation:
Carl Zeiss Microscopy, Pleasanton, CA, USA.
Stephen T. Kelly
Affiliation:
Carl Zeiss Microscopy, Pleasanton, CA, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Characterization of Components Fabricated by Additive Manufacturing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2558 - 2559
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Loh, GH et al. , Additive Manufacturing 23 (2018), p. 34.Google Scholar
[2]Anderson, IE, White, EMH and Dehoff, R, Current Opinion in Solid State and Materials Science 22 (2018), p. 8.Google Scholar
[3]McDonald, SA et al. , Scientific Reports 7 (2017), p. 5251.Google Scholar