Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Ding, Z.
Pascal, E.
and
De Graef, M.
2020.
Indexing of electron back-scatter diffraction patterns using a convolutional neural network.
Acta Materialia,
Vol. 199,
Issue. ,
p.
370.
Ernould, Clément
Beausir, Benoît
Fundenberger, Jean-Jacques
Taupin, Vincent
and
Bouzy, Emmanuel
2020.
Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD.
Scripta Materialia,
Vol. 185,
Issue. ,
p.
30.
Ding, Zihao
Zhu, Chaoyi
and
De Graef, Marc
2021.
Determining crystallographic orientation via hybrid convolutional neural network.
Materials Characterization,
Vol. 178,
Issue. ,
p.
111213.
Ernould, Clément
Beausir, Benoît
Fundenberger, Jean-Jacques
Taupin, Vincent
and
Bouzy, Emmanuel
2022.
Vol. 223,
Issue. ,
p.
155.
Zhu, Chaoyi
Kurniawan, Christian
Ochsendorf, Marcus
An, Dayong
Zaefferer, Stefan
and
De Graef, Marc
2022.
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms.
Ultramicroscopy,
Vol. 233,
Issue. ,
p.
113407.
Ernould, Clément
Beausir, Benoît
Fundenberger, Jean-Jacques
Taupin, Vincent
and
Bouzy, Emmanuel
2022.
Vol. 223,
Issue. ,
p.
1.
Ernould, Clément
Beausir, Benoît
Fundenberger, Jean-Jacques
Taupin, Vincent
and
Bouzy, Emmanuel
2022.
Vol. 223,
Issue. ,
p.
75.
Ding, Zihao
and
De Graef, Marc
2023.
Parametric simulation of electron backscatter diffraction patterns through generative models.
npj Computational Materials,
Vol. 9,
Issue. 1,
Zhang, Tianbi
and
Britton, T.Ben
2024.
Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors.
Ultramicroscopy,
Vol. 257,
Issue. ,
p.
113902.