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Phase Characterization of Two-Phase BiSn Alloy Nanoparticles Using Conventional TEM and EFTEM Spectral Imaging Techniques

Published online by Cambridge University Press:  26 July 2009

CT Schamp ,
W-S Cheng  and
WA Jesser
CT Schamp
Affiliation:
CeriumLabs
W-S Cheng
Affiliation:
University of Virginia
WA Jesser
Affiliation:
University of Virginia

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1314 - 1315
Copyright
Copyright © Microscopy Society of America 2009