Microscopy and Microanalysis: Volume 9 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract

Quantitative atomic-scale profiles of oxygen vacancies in SrTiO3

Materials Science Applications Of A Monochromated TEM

Evolution of Surface Morphology during Focused Ion Beam Sputtering and Gas-assisted Sputtering Processes

Avoiding the Curtaining Effect: Backside Milling by FIB INLO

FIB Micro-Pillar Sampling Technique For 3D Stem Observation And Its Application

Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis

Microelectronic Fabrication of Transition Edge Sensors

Improvements to Energy Resolution of an X-ray Energy Dispersive Spectrum by Deconvolution Using the Zero Strobe Peak

In-situ crystallisation study of phase-change material using transmission electron microscopy

EFTEM Study of Phase Separations in Borosilicate Glasses Under Electron Beam Irradiation

In-situ Magnetodynamic Experiments Achieved with the Design of an In-plane Magnetic Field Specimen Holder

In-Situ Focused Ion Beam Micropatterning of Ge Islands

Magnetic domain wall energies in Fe/Cu(100) measured from direct observations of thermal fluctuations using SPLEEM

Experience with the IBM Sub-Angstrom STEM

New Possibility of Direct Observations of Quantum Dots, Nanotubes and Interfaces by Cs-Corrected HRTEM

Direct Determination of Imaging Parameters from Wave Functions in HRTEM

Low Energy STEM of Multi-Layers and Dopant Profiles

The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity

Recent development of an UHR and ULV FE-SEM with various signal detection capabilities and its applications

Examining the Possibilities and Pitfalls of Three Dimensional Energy Filtered Transmission Electron Microscopy (3D-EFTEM)

Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract