Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-19T12:42:25.791Z Has data issue: false hasContentIssue false
  • English
  • Français

A New High-Resolution Electron Microscope with Easy Operation System for Nano Analysis

Published online by Cambridge University Press:  01 November 2002

M. Matsushita ,
M. Ohsaki ,
Y. Kondo ,
M. Naruse ,
T. Honda  and
M. Kersker
M. Matsushita
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
M. Ohsaki
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
Y. Kondo
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
M. Naruse
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
T. Honda
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
M. Kersker
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA 01960, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1106 - 1107
Copyright
Copyright © Microscopy Society of America 2002