Microscopy and Microanalysis: Volume 12 - Issue S02

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Volume 12 - Issue S02 - August 2006

Contents

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How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3-D

Research Article

How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3D
M Uchic
Published online by Cambridge University Press:

31 July 2006, pp. 122-123
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

How to convert 2D serial sectioning images into a 3D dataset

Research Article

How to Convert 2-D Serial Sectioning Images into a 3-D Data Set
M De Graef
Published online by Cambridge University Press:

31 July 2006, pp. 124-125
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Research Article

An Introduction to Helium Ion Microscopy
J Notte, R Hill, S McVey, L Farkas, R Percival, B Ward
Published online by Cambridge University Press:

31 July 2006, pp. 126-127
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Focused Ion Beam as a Nanofabrication Tool for Rapid Prototyping of Nanomagnetic Devices
S Khizroev, A Lavrenov, N Amos, R Chomko, D Litvinov
Published online by Cambridge University Press:

31 July 2006, pp. 128-129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Three-dimensional Nanostructure Fabrication by Focused-ion-beam Chemical-vapor-deposition
S Matsui
Published online by Cambridge University Press:

31 July 2006, pp. 130-131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Advances in STEM Techniques for Materials Characterization

Research Article

Aberration-Corrected STEM - More than just Higher Resolution
S Pennycook, M Chisholm, A Lupini, Y Peng, M Varela, K van Benthem, A Borisevich, N de Jonge, M Oxley
Published online by Cambridge University Press:

31 July 2006, pp. 132-133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Applications of Atomic Scale Scanning Transmission Electron Microscopy
ND Browning, R Erni, CJ Mitterbauer, L Fu, M Chi, S Mehraeen, M Herrera, H-T Chou, H Stahlberg, Q Ramasse, A Ziegler, G Nicotra, I Arslan, J-C Idrobo, E Stach, A Bleloch
Published online by Cambridge University Press:

31 July 2006, pp. 134-135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

HAADF Studies of the Si3N4 IGF Interface
D Cockayne, G Winkelman, C Dwyer, M Doblinger
Published online by Cambridge University Press:

31 July 2006, pp. 136-137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Observing Impurity Doping in Oxide Grain Boundaries Using STEM
JP Buban, Y Sato, K Matsunaga, N Shibata, T Yamamoto, Y Ikuhara
Published online by Cambridge University Press:

31 July 2006, pp. 138-139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping

Research Article

Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM
EA Kenik, H Demers
Published online by Cambridge University Press:

31 July 2006, pp. 140-141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Progress of Elemental/Compositional Mapping via X-rays and Energy-Loss Electrons in Analytical Electron Microscopes
M Watanabe, MG Burke, D Williams
Published online by Cambridge University Press:

31 July 2006, pp. 142-143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

EDS and EELS Spectrum Imaging of Nanostructured Al2O3-MgO-MgAl2O4
J Bentley, JF Al-Sharab, F Cosandey
Published online by Cambridge University Press:

31 July 2006, pp. 144-145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Ultrafast Electron Microscopy

Research Article

Monchromatic Photo-Field Electron Emission Sources
T Vecchione, U Weierstall, C Edgcombe, J Spence
Published online by Cambridge University Press:

31 July 2006, pp. 146-147
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Observation of Transient Phase Formation in Reactive Multilayer Foils using Conventional and Dynamic Transmission Electron Microscopy (DTEM)
JS Kim, BW Reed, ND Browning, GH Campbell
Published online by Cambridge University Press:

31 July 2006, pp. 148-149
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Towards Ultrafast Diffraction and Spectroscopy of Interfaces and Nanomaterials Using Femtosecond Focused Electron Pulses
C-Y Ruan, Y Murooka, RK Raman, R Murdick, M Khasawneh
Published online by Cambridge University Press:

31 July 2006, pp. 150-151
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Advances in Low Voltage Microscopy and Microanalysis

Research Article

The Scanning Low Energy Electron Microscopy (SLEEM) Mode in SEM
L Frank, I Mullerova
Published online by Cambridge University Press:

31 July 2006, pp. 152-153
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

The History and Future of the SEM – A Personal View.
OC Wells
Published online by Cambridge University Press:

31 July 2006, pp. 154-155
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Probing Carrier Behavior at the Nanoscale in Gallium Nitride using Low Voltage Cathodoluminescence
MR Phillips, D Drouin, N Pauc
Published online by Cambridge University Press:

31 July 2006, pp. 156-157
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Approaching the 1-Å barrier in the CTEM

Research Article

Present Status of Cs-corrected HRTEM and Future Prospects
N Tanaka, J Yamasaki, K Hirahara, K Yoshida, K Saitoh
Published online by Cambridge University Press:

31 July 2006, pp. 158-159
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Information Content in Aberration Corrected High-Resolution TEM Images
M Hytch, F Houdellier, E Snoeck, M-J Casanove
Published online by Cambridge University Press:

31 July 2006, pp. 160-161
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 4 of 45

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Microscopy and Microanalysis

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Volume 12 - Issue S02 - August 2006

How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3-D

Research Article

How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3D

How to convert 2D serial sectioning images into a 3D dataset

Research Article

How to Convert 2-D Serial Sectioning Images into a 3-D Data Set

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Research Article

An Introduction to Helium Ion Microscopy

Focused Ion Beam as a Nanofabrication Tool for Rapid Prototyping of Nanomagnetic Devices

Three-dimensional Nanostructure Fabrication by Focused-ion-beam Chemical-vapor-deposition

Advances in STEM Techniques for Materials Characterization

Research Article

Aberration-Corrected STEM - More than just Higher Resolution

Applications of Atomic Scale Scanning Transmission Electron Microscopy

HAADF Studies of the Si3N4 IGF Interface

Observing Impurity Doping in Oxide Grain Boundaries Using STEM

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping

Research Article

Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM

Progress of Elemental/Compositional Mapping via X-rays and Energy-Loss Electrons in Analytical Electron Microscopes

EDS and EELS Spectrum Imaging of Nanostructured Al2O3-MgO-MgAl2O4

Ultrafast Electron Microscopy

Research Article

Monchromatic Photo-Field Electron Emission Sources

Observation of Transient Phase Formation in Reactive Multilayer Foils using Conventional and Dynamic Transmission Electron Microscopy (DTEM)

Towards Ultrafast Diffraction and Spectroscopy of Interfaces and Nanomaterials Using Femtosecond Focused Electron Pulses

Advances in Low Voltage Microscopy and Microanalysis

Research Article

The Scanning Low Energy Electron Microscopy (SLEEM) Mode in SEM

The History and Future of the SEM – A Personal View.

Probing Carrier Behavior at the Nanoscale in Gallium Nitride using Low Voltage Cathodoluminescence

Approaching the 1-Å barrier in the CTEM

Research Article

Present Status of Cs-corrected HRTEM and Future Prospects

Information Content in Aberration Corrected High-Resolution TEM Images

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 12 - Issue S02 - August 2006

How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3-D

Research Article

How to convert 2D serial sectioning images into a 3D dataset

Research Article

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Research Article

Advances in STEM Techniques for Materials Characterization

Research Article

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping

Research Article

Ultrafast Electron Microscopy

Research Article

Advances in Low Voltage Microscopy and Microanalysis

Research Article

Approaching the 1-Å barrier in the CTEM

Research Article