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Focused Ion Beam as a Nanofabrication Tool for Rapid Prototyping of Nanomagnetic Devices

Published online by Cambridge University Press:  31 July 2006

S Khizroev ,
A Lavrenov ,
N Amos ,
R Chomko  and
D Litvinov
S Khizroev
Affiliation:
Florida International University
A Lavrenov
Affiliation:
Florida International University
N Amos
Affiliation:
Florida International University
R Chomko
Affiliation:
Florida International University
D Litvinov
Affiliation:
University of Houston
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 128 - 129
Copyright
© 2006 Microscopy Society of America

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