Microscopy and Microanalysis: Volume 12 - Issue S02

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Volume 12 - Issue S02 - August 2006

Contents

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Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

Variogram Characterization of the Length Scales of Topographic Patterns
NO Fuentes, EA Favret
Published online by Cambridge University Press:

31 July 2006, pp. 82-83
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

TEM Automation

Research Article

Advantages and Objectives of High-throughput Data Collection in Single-particle Cryo-EM
RM Glaeser, J Lee, D Typke
Published online by Cambridge University Press:

31 July 2006, pp. 84-85
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions
KJ Hayworth, N Kasthuri, R Schalek, JW Lichtman
Published online by Cambridge University Press:

31 July 2006, pp. 86-87
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Automated Acquisition of Tomographic and Random Conical Tilt Series and Real-time Reconstruction Using UCSF Tomography
SQ Zheng, MB Braunfeld, B Keszthelyi, E Branlund, JM Kollman, JW Sedat, DA Agard
Published online by Cambridge University Press:

31 July 2006, pp. 88-89
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Serial sectioning in the micron-plus range, and modern techniques for automation

Research Article

Serial Sectioning in the Micron-plus Range and Modern Techniques for Automation
JE Spowart
Published online by Cambridge University Press:

31 July 2006, pp. 90-91
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution

Research Article

Cryo-electron Tomography: A Powerful Analytical Tool for the Study of Cells and Organelles at Molecular Resolution
D Nicastro
Published online by Cambridge University Press:

31 July 2006, pp. 92-93
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Research Article

High Pressure Freezing: The Good, the Bad and the Ugly
K McDonald
Published online by Cambridge University Press:

31 July 2006, pp. 94-95
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Nuclear Structures in a High Resolution Cryo-SEM
P Walther, V Cordes
Published online by Cambridge University Press:

31 July 2006, pp. 96-97
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Focused Ion Beam (FIB) Preparation Methods for 3-D Biological Cryo-TEM
M Marko, C-E Hsieh, R Shalek, C Ting, C Mannella, J Frank
Published online by Cambridge University Press:

31 July 2006, pp. 98-99
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

High Pressure Freezing of Brain Tissue Slices
D Studer, S Zhao, W Graber, P Eggli, M Frotscher
Published online by Cambridge University Press:

31 July 2006, pp. 100-101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Electron Energy Loss Spectroscopy for the 21st Century

Research Article

Limitations of Electron Energy-Loss Spectroscopy
R Egerton
Published online by Cambridge University Press:

31 July 2006, pp. 102-103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Detection Limits for EELS Analysis of Biological Materials
RD Leapman
Published online by Cambridge University Press:

31 July 2006, pp. 104-105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Improvement of TEM-EELS and Its Application for Materials in Semiconductor Devices
K Kimoto, K Ishizuka, Y Matsui
Published online by Cambridge University Press:

31 July 2006, pp. 106-107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Perfection in Theoretical Modeling of Electron Energy Loss Spectra: Is it attainable?
P Rez
Published online by Cambridge University Press:

31 July 2006, pp. 108-109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Response of Inhomogeneous Media to Valence Excitation by Fast Electrons
A Howie, A Rivacoba, J Garcia de Abajo
Published online by Cambridge University Press:

31 July 2006, pp. 110-111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS
RF Klie, MA Schofield, M Varela, SJ Pennycook, A Bleloch, Y Zhu
Published online by Cambridge University Press:

31 July 2006, pp. 112-113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides
G Radtke, C Maunders, S Lazar, AD Lozano-Gorrin, JE Greedan, GA Botton
Published online by Cambridge University Press:

31 July 2006, pp. 114-115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Modern Auger Electron Spectroscopy for Chemical Surface Analysis
D Paul, D Watson, J Moulder, S Bryan, S Alnabulsi
Published online by Cambridge University Press:

31 July 2006, pp. 116-117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Enhancements in X-ray Photoelectron Spectroscopy for Improved Materials Characterization
D Surman
Published online by Cambridge University Press:

31 July 2006, pp. 118-119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical Microscope
A Schnieders
Published online by Cambridge University Press:

31 July 2006, pp. 120-121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 3 of 45

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Microscopy and Microanalysis

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Volume 12 - Issue S02 - August 2006

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

Variogram Characterization of the Length Scales of Topographic Patterns

TEM Automation

Research Article

Advantages and Objectives of High-throughput Data Collection in Single-particle Cryo-EM

Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

Automated Acquisition of Tomographic and Random Conical Tilt Series and Real-time Reconstruction Using UCSF Tomography

Serial sectioning in the micron-plus range, and modern techniques for automation

Research Article

Serial Sectioning in the Micron-plus Range and Modern Techniques for Automation

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution

Research Article

Cryo-electron Tomography: A Powerful Analytical Tool for the Study of Cells and Organelles at Molecular Resolution

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Research Article

High Pressure Freezing: The Good, the Bad and the Ugly

Nuclear Structures in a High Resolution Cryo-SEM

Focused Ion Beam (FIB) Preparation Methods for 3-D Biological Cryo-TEM

High Pressure Freezing of Brain Tissue Slices

Electron Energy Loss Spectroscopy for the 21st Century

Research Article

Limitations of Electron Energy-Loss Spectroscopy

Detection Limits for EELS Analysis of Biological Materials

Improvement of TEM-EELS and Its Application for Materials in Semiconductor Devices

Perfection in Theoretical Modeling of Electron Energy Loss Spectra: Is it attainable?

Response of Inhomogeneous Media to Valence Excitation by Fast Electrons

Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS

Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Modern Auger Electron Spectroscopy for Chemical Surface Analysis

Enhancements in X-ray Photoelectron Spectroscopy for Improved Materials Characterization

Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical Microscope

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 12 - Issue S02 - August 2006

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

TEM Automation

Research Article

Serial sectioning in the micron-plus range, and modern techniques for automation

Research Article

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution

Research Article

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Research Article

Electron Energy Loss Spectroscopy for the 21st Century

Research Article

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article