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Applications of Atomic Scale Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  31 July 2006

ND Browning ,
R Erni ,
CJ Mitterbauer ,
L Fu ,
M Chi ,
S Mehraeen ,
M Herrera ,
H-T Chou ,
H Stahlberg  and
Q Ramasse
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ND Browning
Affiliation:
University of California-Davis
R Erni
Affiliation:
FEI Electron Optics
CJ Mitterbauer
Affiliation:
University of California-Davis
L Fu
Affiliation:
University of California-Davis
M Chi
Affiliation:
University of California-Davis
S Mehraeen
Affiliation:
University of California-Davis
M Herrera
Affiliation:
University of California-Davis
H-T Chou
Affiliation:
University of California-Davis
H Stahlberg
Affiliation:
University of California-Davis
Q Ramasse
Affiliation:
Lawrence Berkeley national Laboratory
A Ziegler
Affiliation:
Lawrence Livermore national Laboratory
G Nicotra
Affiliation:
University of Catania
I Arslan
Affiliation:
Sandia National laboratory
J-C Idrobo
Affiliation:
University of Illinois at Chicago
E Stach
Affiliation:
Purdue University
A Bleloch
Affiliation:
UK SuperSTEM
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 134 - 135
Copyright
© 2006 Microscopy Society of America

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