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Variogram Characterization of the Length Scales of Topographic Patterns

Published online by Cambridge University Press:  31 July 2006

NO Fuentes  and
EA Favret
NO Fuentes
Affiliation:
Comisión Nacional de Energía Atómica,Instituto de Tecnología Prof. Jorge A. Sabato
EA Favret
Affiliation:
Instituto de Tecnología Prof. Jorge A. Sabato,Instituto Nacional de Tecnología Agropecuaria
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 82 - 83
Copyright
© 2006 Microscopy Society of America

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