Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 12 Issue s02
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 12 - Issue S02 - August 2006

Contents

Page 13 of 45

Microscopy in Nanoscience and Nanotechnology

Abstract

  • Dielectrophoretic Fabrication and Electron Microscopy Characterization of One-Dimensional-Nanomaterial-Based Devices

  • L Dong, J Jiao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 482-483
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Fabrication and Morphology of ZnO and ZnS Nanoribbon Heterostructure

  • P-S G Kim, M Murphy, XT Zhou, M Couillard, TK Sham, GA Botton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 484-485
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • In-Situ Operation of Nanoelectronic Devices

  • J Cumings, T Brintlinger, K Baloch, Y Qi
  • Published online by Cambridge University Press:
    31 July 2006, pp. 486-487
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Structure and Electrical Transport of Single-Walled Carbon Nanotubes with Intramolecular Junction and Defects

  • T Kim, J-M Zuo
  • Published online by Cambridge University Press:
    31 July 2006, pp. 490-491
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

  • L-M Peng, Q Chen, JY Wang, MS Wang, ZY Zhang, CH Jin, XL Wei
  • Published online by Cambridge University Press:
    31 July 2006, pp. 492-493
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Center for Nanophase Materials Sciences

  • L Horton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 494-495
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Novel Synthesis and Functionalization of Boron Nitride Nanotubes

  • Y Bando, CY Zhi, Q Huang, CC Tang, D Golberg
  • Published online by Cambridge University Press:
    31 July 2006, pp. 496-497
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electron Damage of CdSe Quantum Rods

  • S Maccagnano, KA Mkhoyan, J Calcines, TD Krauss, J Silcox
  • Published online by Cambridge University Press:
    31 July 2006, pp. 498-499
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Ordered Zinc-Vacancy Induced Zn0.75Ox Nanophase Structure

  • Y Ding, R Yang, ZL Wang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 500-501
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Growth of Nanodendrites on Insulator Substrates by Charge-up Induced Deposition and its Decoration with Metal Nanocrystals

  • K Furuya, G Xie, M Song
  • Published online by Cambridge University Press:
    31 July 2006, pp. 502-503
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Dedicated FIB Preparation for TEM Cross-section Samples of Nanowires Grown Vertically on Silicon Substrates

  • M Kaiser, MA Verheijen, AL Roest, EPAM Bakkers
  • Published online by Cambridge University Press:
    31 July 2006, pp. 504-505
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Spin-Polarized STM: Imaging Magnetic Nanostructures with Atomic Resolution

  • M Bode
  • Published online by Cambridge University Press:
    31 July 2006, pp. 506-507
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Scanning Probe Microscopy: Delineating Structure-Property-Processing Relationships in Hybrid Organic/Inorganic Nanomaterials

  • NL Yoder, MC Hersam
  • Published online by Cambridge University Press:
    31 July 2006, pp. 508-509
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials

  • U Schmidt, F Vargas, M Kress, K Weishaupt, O Hollricher
  • Published online by Cambridge University Press:
    31 July 2006, pp. 512-513
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Scanning Probe Energy Loss Spectroscopy

  • R Palmer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 514-515
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Atomic and Electronic Imaging of Oxide Heterostructures

  • DA Muller, L Fitting, A Ohtomo, N Nakagawa, HY Hwang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 516-517
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Atomic Scale Characterization of HgTe/CdTe Superlattices Using STEM Z-Contrast Imaging and VEELS

  • L Fu, N Browning, H-S Jung, C Grein
  • Published online by Cambridge University Press:
    31 July 2006, pp. 518-519
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Diffusion in SixGe1-x/ Si Nanowire Heterostructures

  • X Zhang, J Kulik, E Dickey
  • Published online by Cambridge University Press:
    31 July 2006, pp. 520-521
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 13 of 45