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Volume 12 - Issue S02 - August 2006

Contents

Page 14 of 45

Microscopy in Nanoscience and Nanotechnology

Abstract

  • Spinodal Decomposition of Geometrically Constrained CuNiFe Thin Films

  • JT McKeown, JD Sugar, V Radmilovic, AM Glaeser, R Gronsky
  • Published online by Cambridge University Press:
    31 July 2006, pp. 522-523
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Characterization of AuFe-C Core-shell Nanoparticles

  • H Li, H Dai, L Xing, R Sinclair
  • Published online by Cambridge University Press:
    31 July 2006, pp. 524-525
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Bridging the Imaging Gap in Nanobiology with Three-Dimensional Electron Microscopy

  • S Subramaniam
  • Published online by Cambridge University Press:
    31 July 2006, pp. 526-527
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • A Method for 3 Dimensional Structural and Compositional Imaging of Nano-materials

  • T Yaguchi, Y Kuroda, M Konno, T Kamino, K Kaji, M Watanabe
  • Published online by Cambridge University Press:
    31 July 2006, pp. 528-529
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Three-Dimensional Imaging of Deformed Nanotubes by Metal Contacts using HAADF-STEM Tomography

  • JJ Cha, M Weyland, D Muller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 530-531
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • 3-D Imaging of Non-Spherical Silicon Nanoparticles Embedded in Silicon Oxide by Plasmon Tomography

  • A Yurtsever, M Weyland, D Muller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 532-533
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Statistical Tools for the Local Electrode Atom Probe

  • MP Moody, LT Stephenson, SP Ringer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 536-537
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Sub-80 nm Resolution X-Ray Fluorescence Imaging Spectrometer for Semiconductor Applications

  • S Seshadri, W Yun, M Feser, F Duewer, S Wang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 538-539
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Measurements of Functional Response of Nano-objects using Advanced Electron Microscopy

  • Y Zhu, T Beetz, L Wu, R Klie, L Huang, JW Lau, MA Schofield, VV Volkov, M Beleggia, M Malac
  • Published online by Cambridge University Press:
    31 July 2006, pp. 540-541
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Measuring the Mechanical Behavior of Individual Nanoparticles Inside a TEM

  • ZW Shan, AM Minor, SA Syed Asif, OL Warren
  • Published online by Cambridge University Press:
    31 July 2006, pp. 542-543
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Formation of Oxide Nanostructures Investigated by In Situ UHV-TEM

  • L Sun, J Yang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 544-545
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • In-Situ Growth of Passivation Oxide Layer on Fe-Nanoparticle under Electron-Beam Irradiation in a TEM

  • CM Wang, DR Baer, JE Amonette, MH Engelhard, JJ Antony, Y Qiang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 546-547
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • In situ TEM Investigation of Early–Stage Oxidation of (001) Cu-Au alloys

  • G Zhou, J Eastman, R Birtcher, P Baldo, J Pearson, L Thompson, L Wang, J Yang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 548-549
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Nanostructured Conducting Polymer Coatings for Biomedical Devices

  • D Martin, M Abidian, J Hendricks, S Richardson-Burns, M Meier, D Kim, J Yang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 550-551
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Nano- and Microporosity in Geopolymer Gels

  • JL Bell, M Gordon, WM Kriven
  • Published online by Cambridge University Press:
    31 July 2006, pp. 552-553
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Scanning Tunneling Microscopy and Spectroscopy of Peptide-Wrapped Single-Walled Carbon Nanotubes

  • IH Musselman, VZ Poenitzsch, GR Dieckmann
  • Published online by Cambridge University Press:
    31 July 2006, pp. 554-555
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Nanotechnology in the Laboratory and in Society

  • ED Boyes
  • Published online by Cambridge University Press:
    31 July 2006, pp. 556-557
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Center for Integrated Nanotechnologies

  • JM Phillips, A Taylor, ST Picraux, ND Shinn
  • Published online by Cambridge University Press:
    31 July 2006, pp. 558-559
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Demonstration of Pick and Place Assembly for Scaled MEMS Devices

  • J Jeon, I Gory, G Skidmore, MJ Kim, BE Gnade
  • Published online by Cambridge University Press:
    31 July 2006, pp. 560-561
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 14 of 45