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Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques

Published online by Cambridge University Press:  31 July 2006

M Watanabe ,
D Saxey ,
R Zheng ,
D Williams  and
S Ringer
M Watanabe
Affiliation:
Lehigh University
D Saxey
Affiliation:
University of Sydney
R Zheng
Affiliation:
University of Sydney
D Williams
Affiliation:
Lehigh University
S Ringer
Affiliation:
University of Sydney

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 534 - 535
Copyright
© 2006 Microscopy Society of America