Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract

Field Emission from Zinc Oxide Nanobelt

High Spatial Resolution Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography study of Indium segregation in N-polar InGaN Quantum Wells

Detailed In Situ Observations of Electromigration in Aluminum Wires

In Situ Biasing of Conductive Bridge Resistive Memory Devices Observed in a Transmission Electron Microscope

Point and Extended Defects in Ultra Wide Band Gap β-Ga2O3 Interfaces

Advances in Elemental Electron Tomography for the State-of-the-art Semiconductor Devices and Circuits Characterization and Failure Analysis

Automated STEM/EDS Metrology Characterization of 3D NAND Devices

Toward Automated S/TEM Metrology of Advanced CMOS Devices: Journey to Obtain a Precise and Accurate Measurement

Quantitative Electron Energy Loss Spectroscopy (EELS) Analysis of Flowable CVD Oxide for Shallow Trench Isolation of finFET Integration

Manganese Segregation Behavior in Damascene Metal Lines

Accretion Detection via Scanning Acoustic Microscopy in Microelectronic Components - Considering Symmetry Breaking Effects

Unraveling the Crystal Structure of All-Inorganic Halide Perovskites using CBED and Electron Ptychography

Nanometer-scale Resolved Cathodoluminescence Imaging: New Insights into GaAs/AlGaAs Core-shell Nanowire Lasers

Heterovalent ZnTe/GaSb and ZnSe/GaAs Grown by Molecular Beam Epitaxy

On The Effects of Column Occupancy and Static Atomic Disorder on the Analysis of Chemical Ordering in Ga(P(1-x)Bix) Compounds

TEM characterization of GaSb grown on single crystal offcut Silicon (001)

Structural and Chemical Assessment of InAs/AlGaAs quantum Dot Structures for Enlarged Bandgap Intermediate Band Solar Cells

HAADF-STEM Study of MBE-Grown Dirac Semimetal Cd3As2

Thickness-Dependent Defect Evolution in GaAs0.92Sb0.08/GaAs Heterostructures

Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration Enhanced Epitaxy using Precession Electron Diffraction

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract