Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract

Correlation of Etch Pits and Dislocations in As-grown and Thermal-Cycle-Annealed HgCdTe(211) Films

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract

Optical Spectroscopy at High Spatial Resolution with Fast Electrons

Mapping “Broken” Dark Modes Using Cathodoluminescence in a Scanning Electron Microscope

Near-Field Mid-Infrared Plasmonics in Complex Nanostructures with Monochromated Electron Energy Loss Spectroscopy

Interaction between Relativistic Electrons and Mesoscopic Plasmonic Tapers

Understanding Imaging and Energy-loss Spectra Due to Phonon Excitation

Localized signals in vibrational STEM-EELS

Investigating Molecule-plasmon Interactions in Chemically-functionalized Metal Nanoparticles Using Monochromated EELS

Chemical Nano-Imaging with Tip-Enhanced Vibrational Spectroscopy

Exploring Vibrational and Valence Loss Spectra from Oxide Nanoparticles

Detecting Sub Bandgap Energies in CIGS with Electron Energy-Loss Spectroscopy

Local Mapping of Bandgap Electronic State in PrxCe1-xCh2-δ: Elucidating Enhancement and Mechanism of Grain Boundary Electrical Conductivity

Understanding guided light modes in oxide nanoparticles with monochromated EELS

Ultra-High Energy Resolution EELS

STEM-EELS Evaluation of the Dependence of Localized Surface Plasmon Linewidth on the Size of Au Nanoparticles

Predicting the Electronic Structure of CeO2 Grain Boundaries for Comparison with Atomic Resolution EELS

EELS Investigation of Al2O3 at 30 keV and below; First Results of Alumina's Structural Sensitivity to a Low-Energy Electron Beam

Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World?

Probing Interfacial and Surface Effects with Vibrational Electron Energy Loss Spectroscopy

Ultrahigh Resolution of Electron Energy Loss Spectroscopy by a Monochromated Titan TEM: Towards Challenging Nanomaterials Characterization

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract