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New Methods for Cross-Section Sample Preparation Using Broad Argon Ion Beam

Published online by Cambridge University Press:  05 August 2007

K Ogura ,
M Kamidaira ,
S Asahina  and
N Erdman
K Ogura
Affiliation:
JEOL Ltd,Japan
M Kamidaira
Affiliation:
JEOL Ltd,Japan
S Asahina
Affiliation:
JEOL Ltd,Japan
N Erdman
Affiliation:
JEOL USA Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1518 - 1519
Copyright
© 2007 Microscopy Society of America

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