Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 32 of 44

Advances in Electron Energy Loss Spectroscopy and Energy-Filtered Imaging

Research Article

Performance of a Monochromator for a 200 kV Analytical Electron Microscope
M Mukai, W Inami, K Omoto, T Kaneyama, T Tomita, K Tsuno, M Terauchi, K Tsuda, Y Sato, M Naruse, T Honda, M Tanaka
Published online by Cambridge University Press:

05 August 2007, pp. 1242-1243
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Initial Results from the First Monochromated FEI Titan 80/300 in the UK.
JM Perkins, Y Wang, M Ardakani, B Shollock, DW McComb
Published online by Cambridge University Press:

05 August 2007, pp. 1244-1245
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Competition between Interface and Bulk Modes in Valence EELS of Thin Films
M Couillard, A Yurtsever, DA Muller
Published online by Cambridge University Press:

05 August 2007, pp. 1246-1247
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Surface Guided Modes and Accurate Thickness Measurements by Monochromated Fast Electrons
A Yurtsever, M Couillard, DA Muller
Published online by Cambridge University Press:

05 August 2007, pp. 1248-1249
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Retardation, Surface and Interface Effects in VEELS
R Erni, ND Browning, P Specht, C Kisielowski
Published online by Cambridge University Press:

05 August 2007, pp. 1250-1251
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Determination of dielectric permittivity from EELSpectra in semiconductor structures
P Potapov, H-J R Engelmann, E Zschech, M Stöger-Pollach
Published online by Cambridge University Press:

05 August 2007, pp. 1252-1253
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Improved Determination of Aerosol Optical Properties from the EEL Spectrum
D Alexander, J Anderson, P Crozier
Published online by Cambridge University Press:

05 August 2007, pp. 1254-1255
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Measuring Nanoscale Morphology of Solvated Polymers Using Spatially Resolved Low-Loss EELS in the cryo-STEM
M Libera, S Yakovlev
Published online by Cambridge University Press:

05 August 2007, pp. 1256-1257
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Multivariate Statistical Analysis of EFTEM data
S Lozano-Perez
Published online by Cambridge University Press:

05 August 2007, pp. 1258-1259
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Chemistry of the Early Solar System As Revealed Through EELS
T Zega
Published online by Cambridge University Press:

05 August 2007, pp. 1260-1261
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

EELS Valence Mapping in Electron Beam Sensitive FeFx/C Nanocomposites
F Cosandey, J Al-Sharab, G Amatucci, J Bentley
Published online by Cambridge University Press:

05 August 2007, pp. 1262-1263
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-2200FS STEM/TEM
M Watanabe, M Kanno, D Ackland, C Kiely, D Williams
Published online by Cambridge University Press:

05 August 2007, pp. 1264-1265
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Quantitative Study of Valence States of Beam Sensitive Minerals
U Golla-Schindler, R Hinrichs, P Pöml, C Putnis, A Putnis
Published online by Cambridge University Press:

05 August 2007, pp. 1266-1267
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Radiolytic Purification of CaO by Electron Beams
A Mkhoyan, J Silcox, M McGuire, F DiSalvo
Published online by Cambridge University Press:

05 August 2007, pp. 1268-1269
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Compositional Analysis in InAs/InGaAlAs/InP Quantum Wire Structures with Electron Energy Loss Spectroscopy
K Cui, CM Andrei, O Hul'ko, B Robinson, MD Robertson, DA Thompson, GA Botton
Published online by Cambridge University Press:

05 August 2007, pp. 1270-1271
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Short and Medium Range Order in Hydrogenated Diamond-Like Carbon Films
A Liu, R Arenal, X Chen, D Miller, A Erdemir, J Johnson, O Eryilmaz, J Woodford
Published online by Cambridge University Press:

05 August 2007, pp. 1272-1273
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

EELS Investigations of Reference Niobium Oxides and Anodically Grown Niobium Oxide Layers
D Bach, H Störmer, R Schneider, D Gerthsen, W Sigle
Published online by Cambridge University Press:

05 August 2007, pp. 1274-1275
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

ELNES as a Probe of Magnetic Order in Mixed Oxides
DA Eustace, DW McComb, FT Docherty, AJ Craven
Published online by Cambridge University Press:

05 August 2007, pp. 1276-1277
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Observation of the Anisotropy of the Inelastic Scattering of Fast Electrons Accompanied by the K-shell Ionization of a Carbon Nanotube
K Saitoh, K Nagasaka, N Tanaka
Published online by Cambridge University Press:

05 August 2007, pp. 1278-1279
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Energy Loss Spectroscopy of Bi2FeCrO6 Thin Films on SrRuO3/SrTiO3
L Gunawan, R Nechache, C Harnagea, A Pignolet, GA Botton
Published online by Cambridge University Press:

05 August 2007, pp. 1280-1281
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 32 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Advances in Electron Energy Loss Spectroscopy and Energy-Filtered Imaging

Research Article

Performance of a Monochromator for a 200 kV Analytical Electron Microscope

Initial Results from the First Monochromated FEI Titan 80/300 in the UK.

Competition between Interface and Bulk Modes in Valence EELS of Thin Films

Surface Guided Modes and Accurate Thickness Measurements by Monochromated Fast Electrons

Retardation, Surface and Interface Effects in VEELS

Determination of dielectric permittivity from EELSpectra in semiconductor structures

Improved Determination of Aerosol Optical Properties from the EEL Spectrum

Measuring Nanoscale Morphology of Solvated Polymers Using Spatially Resolved Low-Loss EELS in the cryo-STEM

Multivariate Statistical Analysis of EFTEM data

Chemistry of the Early Solar System As Revealed Through EELS

EELS Valence Mapping in Electron Beam Sensitive FeFx/C Nanocomposites

Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-2200FS STEM/TEM

Quantitative Study of Valence States of Beam Sensitive Minerals

Radiolytic Purification of CaO by Electron Beams

Compositional Analysis in InAs/InGaAlAs/InP Quantum Wire Structures with Electron Energy Loss Spectroscopy

Short and Medium Range Order in Hydrogenated Diamond-Like Carbon Films

EELS Investigations of Reference Niobium Oxides and Anodically Grown Niobium Oxide Layers

ELNES as a Probe of Magnetic Order in Mixed Oxides

Observation of the Anisotropy of the Inelastic Scattering of Fast Electrons Accompanied by the K-shell Ionization of a Carbon Nanotube

Electron Energy Loss Spectroscopy of Bi2FeCrO6 Thin Films on SrRuO3/SrTiO3

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Advances in Electron Energy Loss Spectroscopy and Energy-Filtered Imaging

Research Article