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Surface Guided Modes and Accurate Thickness Measurements by Monochromated Fast Electrons

Published online by Cambridge University Press:  05 August 2007

A Yurtsever ,
M Couillard  and
DA Muller
A Yurtsever
Affiliation:
Cornell University
M Couillard
Affiliation:
Cornell University
DA Muller
Affiliation:
Cornell University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1248 - 1249
Copyright
© 2007 Microscopy Society of America

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