Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 30 of 44

Aberration Correction in the Electron Microscope

Research Article

Atomic Resolution Cs-Corrected HR-S/TEM from 80-300kV
B Freitag, M Stekelenburg, J Ringnalda, D Hubert
Published online by Cambridge University Press:

05 August 2007, pp. 1162-1163
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Cs-Corrected Cryo-Electron Microscopy for Biological Samples
JE Evans, C Hetherington, AI Kirkland, H Stahlberg, ND Browning
Published online by Cambridge University Press:

05 August 2007, pp. 1164-1165
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Performance Characteristics of an Aberration-Corrected Jeol JEM 2100F STEM/TEM at the University of South Carolina
D Zhao, T Aoki, G Koley, Z Cai
Published online by Cambridge University Press:

05 August 2007, pp. 1166-1167
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Microscopy Research in an Aberration-free Environment: Applications

Research Article

New Views of Materials through Aberration-Corrected STEM
S Pennycook, AR Lupini, K van Benthem, M Varela, M Chisholm, AY Borisevich, C Contescu, NC Gallego, T Pennycook, Y Peng, M Oxley
Published online by Cambridge University Press:

05 August 2007, pp. 1168-1169
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

New Developments in Focal-Series Reconstruction
P Schlossmacher, C Kuebel, B Freitag, D Hubert, R Perquin
Published online by Cambridge University Press:

05 August 2007, pp. 1170-1171
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

STEM Characterization of Ceramic Grain Boundaries
Y Ikuhara, J Buban, Y Sato, N Shibata, T Yamamoto
Published online by Cambridge University Press:

05 August 2007, pp. 1172-1173
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Imaging Non-stoichiometric Dislocation Cores in Alumina
MF Chisholm, N Shibata, A Nakamura, S Pennycook, T Yamamoto, Y Ikuhara
Published online by Cambridge University Press:

05 August 2007, pp. 1174-1175
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Characterization of Hydrogen-Encapsulated Type-I Silicon Clathrate
NL Okamoto, D Neiner, QM Ramasse, CL Condron, SM Kauzlarich, ND Browning
Published online by Cambridge University Press:

05 August 2007, pp. 1176-1177
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS
R Klie, E Hammas, Y Zhao, G Yang, Y Zhu
Published online by Cambridge University Press:

05 August 2007, pp. 1178-1179
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Aberration Corrected and Monochromated STEM/TEM for Materials Science
ND Browning, I Arslan, JP Bradley, M Chi, Z Dai, R Erni, M Herrera, NL Okamoto, QM Ramasse
Published online by Cambridge University Press:

05 August 2007, pp. 1180-1181
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Local Structure Characterization in Nanomaterials using Aberration Corrected STEM
K van Benthem, S-H Oh, M Oxley, S Rashkeev, A Marinopoulos, R Buzcko, ST Pantelides, S Pennycook
Published online by Cambridge University Press:

05 August 2007, pp. 1182-1183
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Applications of Aberration-free Microscopy from Strain Mapping to Quantitative Electron Diffraction
M Hÿ
Published online by Cambridge University Press:

05 August 2007, pp. 1184-1185
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Direct Observation of Site Hopping of Individual Dopant Atoms in Si Crystal, by Cs-corrected STEM
J Yamasaki, E Okunishi, H Sawada, N Tanaka
Published online by Cambridge University Press:

05 August 2007, pp. 1186-1187
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Direct Determination of Local Lattice Polarity in Crystals
A Mkhoyan, P Batson, J Cha, W Schaff, J Silcox
Published online by Cambridge University Press:

05 August 2007, pp. 1188-1189
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Atomic-Scale Characterization and Optical Properties of Metal Nanoparticles Embedded in Alumina Matrices
JC Idrobo, A Halabica, S Rashkeev, MV Glazoff, LA Boatner, RF Haglund, S Pennycook, ST Pantelides
Published online by Cambridge University Press:

05 August 2007, pp. 1190-1191
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Aberration-Corrected STEM ex-situ Studies of Catalysts
DA Blom, LF Allard, C Narula, M Moses
Published online by Cambridge University Press:

05 August 2007, pp. 1192-1193
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Strain Distributions in Au Nanoparticles by Aberration-Corrected HREM
CL Johnson, E Snoeck, M Hÿ, CEMES-CNRS, France
Published online by Cambridge University Press:

05 August 2007, pp. 1194-1195
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Z-STEM of L1o Ordering in FePt Magnetic Nanoparticles
J Wittig, J Bentley, AR Lupini, C Lukehart
Published online by Cambridge University Press:

05 August 2007, pp. 1196-1197
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Applications of Aberration-Corrected Scanning Transmission Electron Microscopy for Atomic-Scale Characterization
M Watanabe, H Hojo, D Ackland, C Kiely, D Williams
Published online by Cambridge University Press:

05 August 2007, pp. 1198-1199
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Use of Dark-field STEM Imaging to Reveal Phase Separation in a β- Stabilized Titanium Alloy
H Fraser, A Genç, The Ohio State University
Published online by Cambridge University Press:

05 August 2007, pp. 1200-1201
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 30 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Aberration Correction in the Electron Microscope

Research Article

Atomic Resolution Cs-Corrected HR-S/TEM from 80-300kV

Cs-Corrected Cryo-Electron Microscopy for Biological Samples

Performance Characteristics of an Aberration-Corrected Jeol JEM 2100F STEM/TEM at the University of South Carolina

Electron Microscopy Research in an Aberration-free Environment: Applications

Research Article

New Views of Materials through Aberration-Corrected STEM

New Developments in Focal-Series Reconstruction

STEM Characterization of Ceramic Grain Boundaries

Imaging Non-stoichiometric Dislocation Cores in Alumina

Characterization of Hydrogen-Encapsulated Type-I Silicon Clathrate

Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS

Aberration Corrected and Monochromated STEM/TEM for Materials Science

Local Structure Characterization in Nanomaterials using Aberration Corrected STEM

Applications of Aberration-free Microscopy from Strain Mapping to Quantitative Electron Diffraction

Direct Observation of Site Hopping of Individual Dopant Atoms in Si Crystal, by Cs-corrected STEM

Direct Determination of Local Lattice Polarity in Crystals

Atomic-Scale Characterization and Optical Properties of Metal Nanoparticles Embedded in Alumina Matrices

Aberration-Corrected STEM ex-situ Studies of Catalysts

Strain Distributions in Au Nanoparticles by Aberration-Corrected HREM

Z-STEM of L1o Ordering in FePt Magnetic Nanoparticles

Applications of Aberration-Corrected Scanning Transmission Electron Microscopy for Atomic-Scale Characterization

Use of Dark-field STEM Imaging to Reveal Phase Separation in a β- Stabilized Titanium Alloy

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Aberration Correction in the Electron Microscope

Research Article

Electron Microscopy Research in an Aberration-free Environment: Applications

Research Article