Microscopy and Microanalysis: Volume 27 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Microscopy and Microanalysis for Real World Problem Solving

The FIGMAS Online Database of Standards and Reference Materials – an Update

Analysis of Electrochemical Corrosion in Metal form of Ti-Ta-Sn and 316-L Screw in Hank's Solution by SEM

Mitigating Shadowing and Topographic Artifacts Using Dual EDS Detectors

Direct Correlation of Transmission Electron Microscopy and Optical Microscopy for Study of Fluorescent Nanodiamonds

Advances in Analytical STEM-in-SEM

STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites

Beam broadening of keV electrons in matter calculated by numerical solution of the electron transport equation

Microstructural defects in AISI 4000 series steel subjected to a 3% NaCl corrosion process.

Evaluation method of image resolution for the aberration-corrected STEM

Nanoscale orientation mapping made easy: a new sample preparation workflow for rapid, large-area TKD analysis

AN ELECTRON MIRROR AS AN OBJECTIVE LENS OF THE TRANSMISSION ELECTRON MICROSCOPE

Calibration-less quantitative 4D-STEM imaging of amorphous samples

STEM-in-SEM highly deformed structure investigation with focus on electron-transparent specimen preparation

Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy

Customized Automation of Routine EPMA Analyses Using Vendor-Supplied APIs

A new beam alignment method in SEM based on parallax principle

Machine Learning for Automated Analysis of Asbestos Fibres

Automatic Status Checks and Recovery for Tundra Microscope

Rapid and Flexible Few Shot Learning-Based Classification of Scanning Transmission Electron Microscopy Data

Bayesian Approaches to Finding the Needles in the Microscopy Haystack

Adaptive Focused Ion Beam Milling through Machine Learning Algorithm Integration

Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Microscopy and Microanalysis for Real World Problem Solving

Advances in Analytical STEM-in-SEM

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy