Materials Communications
Deep-level transient spectroscopy studies of thermal donor annihilation in silicon by rapid thermal annealing
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- 31 January 2011, pp. 241-243
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Cesium-antimony and cesium-arsenic intercalated graphite
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- 31 January 2011, pp. 244-247
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The effect of grain size on microstructure and stress relaxation in polycrystalline Y1Ba2Cu3O7−δ
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- 31 January 2011, pp. 248-256
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Microstructure and properties of superconducting sputter deposited Y–Ba–Cu–O films
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- 31 January 2011, pp. 257-266
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Reaction pathways for the formation of the YBa2Cu3O7−x compound
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- 31 January 2011, pp. 267-272
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Aurivillius-Popper mixed superconductors in BiO–CuO–(Sr0.5, Ca0.5)O system
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- 31 January 2011, pp. 273-282
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The effect of epitaxy on the upper critical fields of evaporated niobium films
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- 31 January 2011, pp. 283-287
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Microstructure of atomized Ni3Al–B powder
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- 31 January 2011, pp. 288-293
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Effect of grain shape on environmental embrittlement in Ni3Al tested at elevated temperatures
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- 31 January 2011, pp. 294-299
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Structure of amorphous Fe–Cr–P alloys prepared by electrodeposition
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- 31 January 2011, pp. 300-308
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Lattice statics Green's function method for calculation of atomistic structure of grain boundary interfaces in solids: Part I. Harmonic theory
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- 31 January 2011, pp. 309-319
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Lattice statics Green's function method for calculation of atomistic structure of grain boundary interfaces in solids: Part II. Anharmonic theory
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- 31 January 2011, pp. 320-326
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The characterization of an SCS6/Ti–6Al–4V MMC interphase
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- 31 January 2011, pp. 327-335
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Compound formation and kinetics in Al–Pd2Si reactions
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- 31 January 2011, pp. 336-342
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Partially ionized beam deposition of oriented films
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- 31 January 2011, pp. 343-349
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Polycrystalline hexagonal boron nitride films on SiO2 for III–V semiconductor applications
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- 31 January 2011, pp. 350-354
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Mechanical properties and dislocation dynamics of GaP
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- 31 January 2011, pp. 355-360
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Mechanical property and dislocation dynamics of GaAsP alloy semiconductor
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- 31 January 2011, pp. 361-365
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Plasma deposition of a–Si, Ge: H, F thin films from SiF4–GeH4–H2 mixturesa)
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- 31 January 2011, pp. 366-372
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Characterization of diamond thin films: Diamond phase identification, surface morphology, and defect structures
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- 31 January 2011, pp. 373-384
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