36 results
An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron Microscopy
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- Microscopy Today / Volume 30 / Issue 6 / November 2022
- Published online by Cambridge University Press:
- 24 November 2022, pp. 20-27
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- November 2022
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Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?
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- Microscopy and Microanalysis , FirstView
- Published online by Cambridge University Press:
- 05 September 2022, pp. 1-10
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Ronchigram Simulation and Aberration Correction Training Using Ronchigram.com
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- Microscopy Today / Volume 30 / Issue 5 / September 2022
- Published online by Cambridge University Press:
- 22 September 2022, pp. 40-43
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- September 2022
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X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam Lines
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- Microscopy and Microanalysis , FirstView
- Published online by Cambridge University Press:
- 10 May 2022, pp. 1-7
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2 - History of Atomic-Scale Microscopy
- from Introductory Section
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- Atomic-Scale Analytical Tomography
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- 03 March 2022
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- 24 March 2022, pp 11-39
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3 - Development of ASAT as a Concept
- from Introductory Section
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- Atomic-Scale Analytical Tomography
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- 03 March 2022
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- 24 March 2022, pp 40-52
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Optimal STEM Convergence Angle Selection Using a Convolutional Neural Network and the Strehl Ratio
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- Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
- Published online by Cambridge University Press:
- 06 August 2020, pp. 921-928
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- October 2020
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Introduction to the Ronchigram and its Calculation with Ronchigram.com
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- Microscopy Today / Volume 27 / Issue 3 / May 2019
- Published online by Cambridge University Press:
- 03 May 2019, pp. 12-15
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- May 2019
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Why Do We Need to Use Three-Dimensional (3D) Fourier Transform (FT) Analysis to Evaluate a High-Performance Transmission Electron Microscope (TEM)?
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- Microscopy and Microanalysis / Volume 22 / Issue 5 / October 2016
- Published online by Cambridge University Press:
- 27 October 2016, pp. 971-980
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- October 2016
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Annular Focused Electron/Ion Beams for Combining High Spatial Resolution with High Probe Current
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- Microscopy and Microanalysis / Volume 22 / Issue 5 / October 2016
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- 09 September 2016, pp. 948-954
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- October 2016
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Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images
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- Microscopy and Microanalysis / Volume 21 / Issue 2 / April 2015
- Published online by Cambridge University Press:
- 19 January 2015, pp. 436-441
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- April 2015
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Aberration-Corrected X-Ray Spectrum Imaging and Fresnel Contrast to Differentiate Nanoclusters and Cavities in Helium-Irradiated Alloy 14YWT
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- Microscopy and Microanalysis / Volume 20 / Issue 2 / April 2014
- Published online by Cambridge University Press:
- 06 March 2014, pp. 613-626
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- April 2014
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Quantitative Annular Dark Field Electron Microscopy Using Single Electron Signals
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- Microscopy and Microanalysis / Volume 20 / Issue 1 / February 2014
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- 29 October 2013, pp. 99-110
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- February 2014
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A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments
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- Microscopy and Microanalysis / Volume 19 / Issue 2 / April 2013
- Published online by Cambridge University Press:
- 04 March 2013, pp. 470-478
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- April 2013
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Operation of TEAM I in a User Environment at NCEM
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- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
- Published online by Cambridge University Press:
- 31 July 2012, pp. 676-683
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- August 2012
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The First Years of the Aberration-Corrected Electron Microscopy Century
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- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
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- 31 July 2012, pp. 652-655
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- August 2012
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Data Processing for Atomic Resolution Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
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- 15 June 2012, pp. 667-675
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- August 2012
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Environmental Transmission Electron Microscopy in an Aberration-Corrected Environment
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- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
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- 12 June 2012, pp. 684-690
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- August 2012
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Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires
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- Microscopy and Microanalysis / Volume 17 / Issue 5 / October 2011
- Published online by Cambridge University Press:
- 08 September 2011, pp. 752-758
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- October 2011
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The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue 5 / October 2011
- Published online by Cambridge University Press:
- 31 August 2011, pp. 817-826
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- October 2011
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