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Operation of TEAM I in a User Environment at NCEM

Published online by Cambridge University Press:  31 July 2012

Peter Ercius ,
Markus Boese ,
Thomas Duden  and
Ulrich Dahmen
Peter Ercius*
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, MS 72-150, Berkeley, CA 94720, USA
Markus Boese
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, MS 72-150, Berkeley, CA 94720, USA
Thomas Duden
Affiliation:
T.D. Scientific Engineering Services, Borgsenallee 35, D-33649 3B, Germany
Ulrich Dahmen
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, MS 72-150, Berkeley, CA 94720, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

TEAM I is the final product of the Transmission Electron Aberration-corrected Microscope (TEAM) Project, a collaborative project funded by the Department of Energy with the goal of designing and building a platform for a next generation aberration-corrected electron microscope capable of image resolution of up to 50 pm. The TEAM instrument incorporates a number of new technologies, including spherical- and chromatic-aberration correction, an all-piezo-electric sample stage and an active-pixel direct electron detector. This article describes the functionality of this advanced instrumentation, its response to changes in environment or operating conditions, and its stability during daily operation within the National Center for Electron Microscopy user facility.

Keywords

aberration correctionTEMlow-voltageTEAMdirect electron detectorpiezo stagegrapheneSTEM
Type
Special Section: Aberration-Corrected Electron Microscopy
Information
Microscopy and Microanalysis , Volume 18 , Issue 4 , August 2012 , pp. 676 - 683
Copyright
Copyright © Microscopy Society of America 2012

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