8 results
Radiation-Induced Deep-Level Traps in CCD Image Sensors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 994 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0994-F12-07
- Print publication:
- 2007
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Bright-Pixel Defects in Irradiated CCD Image Sensors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 994 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0994-F12-06
- Print publication:
- 2007
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Silicon Wafer Defect Self-Characterization with CCD Image Sensors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 864 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, E6.3
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- 2005
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Defect Engineering in CCD Image Sensors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 719 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, F5.2
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- 2002
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Deep-Level Traps in CCD Image Sensors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 510 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 475
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- January 1998
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Dark Current Spectroscopy Of Metals In Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 442 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 187
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- 1996
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Probing Metal Defects in CCD Image Sensors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 713
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- 1995
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Effects of Deliberate Metal Contamination on CCD Imagers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 262 / 1992
- Published online by Cambridge University Press:
- 03 September 2012, 769
- Print publication:
- 1992
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