3 results
Direct Imaging of Microstructural Changes in Si Induced by FIB-Patterning with Si++ and Ga+ Ions
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 656-657
- Print publication:
- July 2011
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In Situ Reflection Electron Microscopy of Ge Island Nucleation on Mesa Structures
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 1 / February 2004
- Published online by Cambridge University Press:
- 22 January 2004, pp. 105-111
- Print publication:
- February 2004
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In-Situ Focused Ion Beam Micropatterning of Ge Islands
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 132-134
- Print publication:
- August 2003
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