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In situ TEM Approaches to Controlling the Growth of Semiconductors on 2D Materials
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1424-1425
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- August 2019
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Contributors
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- Book:
- Fertility Preservation in Male Cancer Patients
- Published online:
- 05 March 2013
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- 21 February 2013, pp vii-x
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Multiple Double Cross-Section Transmission Electron Microscope Sample Preparation of Specific Sub-10 nm Diameter Si Nanowire Devices
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 6 / December 2011
- Published online by Cambridge University Press:
- 10 November 2011, pp. 889-895
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- December 2011
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Three-Dimensional Measurement of Line Edge Roughness in Copper Wires Using Electron Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue 3 / June 2009
- Published online by Cambridge University Press:
- 22 May 2009, pp. 244-250
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- June 2009
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Tem Analysis of Interfacial Phases in Alumina-Ferrite Systems
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- MRS Online Proceedings Library Archive / Volume 122 / 1988
- Published online by Cambridge University Press:
- 26 February 2011, 39
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- 1988
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