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Light-induced Annealing of Deep Defects in Low Ge Fraction a-Si,Ge:H Alloys: Further Insights into the Fundamentals of Light-induced Degradation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 664 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, A12.5
- Print publication:
- 2001
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A Critical Test of Defect Creation Models in Hydrogenated Amorphous Silicon Alloys
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- Journal:
- MRS Online Proceedings Library Archive / Volume 609 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, A3.3
- Print publication:
- 2000
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Capacitance and Transient Photocapacitance Studies of Tetrahedral Amorphous Carbon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 621 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, R6.6.1
- Print publication:
- 2000
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Characterization of Tetrahedrally Bonded Amorphous Carbon Via Capacitance Techniques
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- Journal:
- MRS Online Proceedings Library Archive / Volume 509 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 119
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- 1998
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Characterization of Tetrahedrally Bonded Amorphous Carbon Via Capacitance Techniques
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- Journal:
- MRS Online Proceedings Library Archive / Volume 508 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 197
- Print publication:
- January 1998
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