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Nanometric-scale Characterization of Mechanical Properties of Materials by Atomic Force Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 196-197
- Print publication:
- August 2003
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Virtual Scanning Electron Microscope: Learning and Training
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 1262-1263
- Print publication:
- August 2003
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Carrier Removal in n+ GaAs:Si by Proton Implantation. a Spectroscopic Study
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- Journal:
- MRS Online Proceedings Library Archive / Volume 104 / 1987
- Published online by Cambridge University Press:
- 26 February 2011, 345
- Print publication:
- 1987
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