Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T01:07:53.946Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanometric-scale Characterization of Mechanical Properties of Materials by Atomic Force Microscopy

Published online by Cambridge University Press:  06 August 2003

Ya. M. Soifer ,
A. Verdyan ,
I. Lapsker  and
J. Azoulay
Ya. M. Soifer
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel
A. Verdyan
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel
I. Lapsker
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel
J. Azoulay
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 196 - 197
Copyright
Copyright © Microscopy Society of America 2003