7 results
Efficient and Precise Sample Preparation by Combination of Pulsed Laser Ablation and FIB Milling
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 636-637
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- July 2012
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Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 658-659
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- July 2011
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In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 170-171
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- July 2009
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EFTEM with omega-type Monochromator – the most advanced analytical tool
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 64-65
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- September 2007
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Recent Results of an in-column Energy Filter TEM with Monochromator
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1160-1161
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- August 2007
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Zero-loss Filtered TEM Imaging of Microelectronic Structures Using In Column Filter Technology
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2068-2069
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- August 2005
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TEM Sample Preparation Using Focused Ion Beam - Capabilities And Limits
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- Journal:
- Microscopy Today / Volume 11 / Issue 2 / April 2003
- Published online by Cambridge University Press:
- 14 March 2018, pp. 22-25
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- April 2003
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