3 results
Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1224-1225
- Print publication:
- August 2014
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- Article
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Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis
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- Journal:
- Microscopy Today / Volume 16 / Issue 4 / July 2008
- Published online by Cambridge University Press:
- 14 March 2018, pp. 42-47
- Print publication:
- July 2008
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Probe Tip Replacement System Inside the FIB
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- Journal:
- MRS Online Proceedings Library Archive / Volume 983 / 2006
- Published online by Cambridge University Press:
- 26 February 2011, 0983-LL05-07
- Print publication:
- 2006
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