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Revealing Solute Clusters in Coalescence by Atom Probe Tomography Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 6 / December 2020
- Published online by Cambridge University Press:
- 14 September 2020, pp. 1079-1087
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- December 2020
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Atom Probe Tomography Characterization of Dopant Distributions in Si FinFET: Challenges and Solutions
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 1 / February 2020
- Published online by Cambridge University Press:
- 22 November 2019, pp. 36-45
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- February 2020
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Sensitivity Analysis of Laser Effect on Mg-Gd-Er Alloy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 714-715
- Print publication:
- July 2017
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A New Approach to the Determination of Concentration Profiles in Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 2 / April 2012
- Published online by Cambridge University Press:
- 03 February 2012, pp. 359-364
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- April 2012
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Overview: Recent Progress in Three-Dimensional Atom Probe Instruments and Applications
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue 6 / December 2007
- Published online by Cambridge University Press:
- 14 November 2007, pp. 408-417
- Print publication:
- December 2007
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